Semiconductor Metrology using Wave Front Phase Imaging on patterned Silicon Wafers

Thursday October 29, 2026 - 11:03 GMT+0000

Author:  Don Jan Olaf Gaudestad

Faculty:  Higher School of Engineering and Technology

PhD Program: Industrial, Computer and Environmental Engineering

Date and time: 06/11/2026 12:30 am

Location of defense: Graduation Hall, Higher School of Engineering and Technology (ESIT)

Director/s: Dr. José Manuel Rodríguez Ramos and Dr. José Gil Marichal Hernández